Semiconductor device including a transistor and a capacitor having an aligned transistor and capacitive element

ABSTRACT

A semiconductor ( 10 ) has an active device, such as a transistor, with a directly underlying passive device, such as a capacitor ( 75, 77, 79 ), that are connected by a via or conductive region ( 52 ) and interconnect ( 68, 99 ). The via or conductive region ( 52 ) contacts a bottom surface of a diffusion or source region ( 22 ) of the transistor and contacts a first ( 75 ) of the capacitor electrodes. A laterally positioned vertical via ( 32, 54, 68 ) and interconnect ( 99 ) contacts a second ( 79 ) of the capacitor electrodes. A metal interconnect or conductive material ( 68 ) may be used as a power plane that saves circuit area by implementing the power plane underneath the transistor rather than adjacent the transistor.

This application is a divisional application of parent U.S. applicationSer. No. 10/946,758 filed Sep. 22, 2004 now U.S. Pat. No. 6,921,961 andassigned to the assignee thereof, which is a divisional application ofparent U.S. application Ser. No. 10/641,544 filed Aug. 15, 2003 now U.S.Pat. No. 6,838,332 and assigned to the assignee hereof.

FIELD OF THE INVENTION

This invention relates generally to integrated circuits, and morespecifically, to making electrical contact to semiconductor circuitelements.

BACKGROUND OF THE INVENTION

Present day semiconductors utilize decoupling capacitors built usingtransistor gates. Decoupling capacitors are needed to prevent voltagedrops in the internal supplies of an integrated circuit when largeamounts of switching activity occur. However, the advances intechnologies are requiring the use of thin gate oxides that result in anon-ideal gate capacitor current leakage. In addition, these capacitorsconsume valuable circuit layout area and thus the utilization of suchcapacitors is limited. Gate capacitor current leakage also results inwasted power consumption that is critical in low-power applications. Theleakage may be mitigated, but at the expense of total decouplingcapacitance and process complexity. Because of a large distance betweenthe decoupling capacitor and active circuitry, the high frequencyresponse of the decoupling capacitor is limited. The distance must belarge because placement of the decoupling capacitor is limited andtypical placement of the decoupling capacitor is further removed fromactive circuitry than desired. Existing decoupling capacitor structurestherefore either suffer from power consumption issues, size issuesand/or electrical efficiency.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention is illustrated by way of example and notlimitation in the accompanying figures, in which like referencesindicate similar elements.

FIGS. 1–3 illustrate in cross-sectional form front side patterning andwafer bonding and thinning of a semiconductor in accordance with anembodiment of the invention; and

FIGS. 4–19 illustrate in cross-sectional form back side patterning anddecoupling capacitor formation with distributed power planes inaccordance with an embodiment of the present invention.

Skilled artisans appreciate that elements in the figures are illustratedfor simplicity and clarity and have not necessarily been drawn to scale.For example, the dimensions of some of the elements in the figures maybe exaggerated relative to other elements to help improve theunderstanding of the embodiments of the present invention.

DETAILED DESCRIPTION

Illustrated in FIG. 1 is a semiconductor device 10 in accordance withthe present invention. It should be understood that the terms “over”,“overlying” and “above” are defined herein for layers and structuresformed with respect to the specific orientation of each figure discussedherein. For example, in FIGS. 1, 2 and 19, the term “over” is used withreference to anything vertically above the illustrated substrate 12.However, the illustrations of FIGS. 3–18 provide an inverse orientationof FIGS. 1, 2 and 19. The term “over” will continue to be used in thediscussion even though such structures are actually below substrate 12with respect to the original orientation of FIGS. 1 and 2. It shouldalso be apparent that semiconductor device 10 and all embodimentsthereof is operational not only in the illustrated orientations but alsoat any orientation, whether 90, 180 degrees or any other orientation.Also, multiple implementations of semiconductor device 10 may be madewherein the orientation of the various devices will vary. An activelayer 16 is bonded onto insulating layer 14 and resides over substrate12. In one form, active layer 16 is a semiconductor layer formed ofbonded silicon, GaAs or SiGe or other semiconductive materials.Substrate 12 may be implemented with any material that provides suitablemechanical support for the elements of semiconductor device 10 and itsformation.

Active devices and contacts to be described herein are patterned usingconventional processing techniques and will not be discussed in specificdetail. These include polysilicon gate 18, sidewall spacer 20, backsidesource region 22, drain region 23, gate contact 26, oxide 28, insulatingetch stop layer 30, oxide 31 and backside contacts 32. The gate is acontrol electrode and the source and drain are current electrodes of atransistor. Source region 22 and drain region 23 are each a diffusionregion and respectively function as a first current electrode and asecond current electrode of a transistor with gate contact 26functioning as a control electrode of the transistor. A drain contact 33makes electrical connection to the drain region 23. Oxide 28 is an oxidelayer of any conventional oxide material used in semiconductors. Itshould be understood that a thin gate oxide (not shown) is underneathpolysilicon gate 18. Backside contacts 32 extend through active layer 16and buried insulating layer 14. It should be noted that in otherembodiments, the backside contacts 32 may not extend beyond a bottomsurface of the oxide 31 making the backside contacts 32 haveapproximately a same depth as drain contact 33.

An etch stop layer 34 is deposited over oxide 28, drain contact 33 andbackside contacts 32. As illustrated, backside contacts 32 representconventional metallization and include the necessary layers forsuccessful deposition, metal confinement and reliability. Backsidecontacts 32 and drain contact 33 function as a via or interconnectstructure.

The insulating layer 14, in one form, may be implemented with SiO₂ andfunctions as an etch stop for the subsequent removal of substrate 12.This structure forms a silicon-on-insulator (SOI) structure. However, itshould be appreciated that the structures provided herein may beimplemented with a bulk substrate that does not contain insulating layer14 or active layer 16. It should be noted that backside contacts 32extend at least to a plane of the lower or first surface of active layer16 if not all the way to substrate 12.

Illustrated in FIG. 2 is semiconductor device 10 wherein a carriersubstrate 38 is connected to etch stop layer 34 via bonding layer 36.Bonding layer 36 may include materials such as oxide or polymer basedbonding such as BCB or polyimide. Carrier substrate 38 functions as amechanical support to allow subsequent removal of substrate 12 andhandling of the semiconductor device 10. It should be apparent that thecarrier substrate 38 may also have active circuitry and does notnecessarily need to function as a sacrificial layer to be subsequentlyremoved. In addition, metal to metal type bonding may be used whereinthe etch stop layer 34 is not required and there is a direct connectionbetween the carrier substrate 38 and backside contacts 32, gate contact26 and drain contact 33.

Illustrated in FIG. 3 is semiconductor device 10 wherein the originalsubstrate 12 has been removed. This removal process may includeconventional techniques such as grinding, chemical mechanical polish(CMP), wet or dry etching selective to the insulating layer 14. Inaddition, this removal process may include non-contact removaltechniques such as laser lift-off, decomposition of the adhesivematerial, decomposition of bonds, etc. Given that the carrier substrate38 provides mechanical support, carrier substrate 38 now becomes abottom surface for device handling. In the bonding and substrate removalprocess, the orientation of semiconductor device has been reversed onehundred eighty degrees in order to facilitate backside processing.Therefore, semiconductor device 10 is inverted in FIG. 3 as comparedwith FIG. 2. Contact to the source region 22 is not illustrated but maybe made from the topside by conventional methods or from the backside astaught herein.

Illustrated in FIG. 4 is semiconductor device 10 wherein photoresistlayer 42 defines openings that align with backside contacts 32 andbackside source region 22. Alternatively, these contacts could connectto other device features such as the drain region 23 from the backside,the polysilicon gate 18 or to any element of an active device such as adiode (not shown) or a passive device such as a resistor (not shown),etc. Layer 40 as illustrated in FIG. 4 is an antireflective coating(ARC) or a hard mask to assist in accurate patterning. This layer 40 isoptional depending upon feature sizes and processing accuracy. Layer 40may be either conductive or insulative, but if layer 40 is conductivethe layer 40 must be removed from the final structure of semiconductordevice 10.

Illustrated in FIG. 5 is semiconductor device 10 wherein the patterndefined in photoresist layer 42 has been transferred into layers 40, 14and 16 using either dry or wet etch processing or a combination thereof.The photoresist layer 42 is then removed and opening 44 and openings 48are created pursuant to the pattern. Opening 44 defines a contact regionto backside source region 22. It should be noted that the etch processthat is performed in order to transfer the pattern is controlled to stopon the backside source region 22 without consuming a significant portionof the backside source region 22. However, in another embodiment thecontrolled etch through opening 44 extends through a portion or all ofthe backside source region 22 as illustrated in FIG. 5 by non-continuouslines for the side boundaries. In the first embodiment, a two-step etchprocess is used. The first step is an oxide-based etch and the secondstep is a silicon-based etch. The silicon-based etch may be implementedas a timed etch. Openings 48 define a contact region adjacent tobackside contacts 32. Alternatively, opening 44 and openings 48 could bedefined in separate patterning and etching steps. Additionally, the needfor openings 48 may be avoided by over-etching layer 14 in FIG. 3 suchthat the backside contacts 32 protrude and are coplanar with a plane atthe top of opening 44. The need for openings 48 may also be avoided bynot using the optional layer 40. Also, in the illustrated form of FIG.5, the photoresist layer 42 is then removed. In yet another embodiment,two vertically abutted contacts (not shown), one above backside sourceregion 22 and one below backside source region, may be electricallyjoined within the backside source region 22 in order to make a contacthaving the same height as backside contacts 32.

Illustrated in FIG. 6 is semiconductor device 10 wherein conductivelayer 50 makes electrical contact to backside contacts 32 and backsidesource region 22. This conductive layer 50 may include copper, tungsten,silver, gold, aluminum or other conductors, in addition to appropriatebarrier materials.

Illustrated in FIG. 7 is semiconductor device 10 wherein conductivelayer 50 is planarized using CMP or electro-polish or other conventionaltechniques. The planarization forms a via or conductive region 52 andconductive regions 54 that have differing heights. Active layer 16 has afirst surface and an opposite second surface where backside sourceregion 22 is formed in the first surface. Source region 22 has a topsurface and a bottom surface. Conductive region 52 is formed in activelayer 16 and has a first end that is formed at the second surface ofactive layer 16. Conductive region 52 has a second end that is formed inthe bottom surface of source region 22. It should again be noted that ifopenings 48 are avoided as mentioned above, then conductive regions 54are not formed. It should be noted that the heights do not have todiffer as backside contacts 32 may be etched to an amount where theheights are substantially the same. In the event that conductive regions54 are defined, one of conductive regions 54 and one of backsidecontacts 32 forms via 56 and via 57, respectively. It should beunderstood that the opening for conductive region 52 may, in analternate embodiment, be etched through backside source region 22 asnoted by the dashed lines in FIG. 7. In such an embodiment, the backsidesource region 22 completely surrounds the conductive region 52 andconductive region 52 extends through the backside source region 22 tothe first surface of active layer 16. It should be observed that at thispoint in the processing there has been provided a semiconductor device10 a semiconductor layer having a first surface and a second surface.The second surface is opposite the first surface. A diffusion region inthe form of backside source region 22 is formed at the first surface ofthe semiconductor layer. The diffusion region has a top surface at thefirst surface of the semiconductor layer and a bottom surface. A via asrepresented by the conductive region 52 is formed in the semiconductorlayer. A portion of the via has a first end formed at or above (i.e.extending into layer 40) the second surface and a second end formed ator below the bottom surface of the diffusion region (i.e. extending intobackside source region 22).

Illustrated in FIG. 8 is semiconductor device 10 wherein layers 58, 60and 62 are formed overlying layer 40. In one form, the layer 58 is adielectric and acts as an etch stop layer. Layer 60 functions as a low kdielectric where “low k” is generally 4.0 or less. Layer 62 acts as anantireflective coating (ARC) material or as a hard mask material and maybe either insulating or conducting. It should be understood that layer62 is an optional layer. The layers 58, 60 and 62 may be formed, in oneform, by conventional deposition techniques. A patterned photoresistlayer 64 overlies layer 62 for defining the position of an electrodethat is closest to a device layer as well as defining conductive routingfor the backside. In one form, the conductive routing is for definingpower and ground conductors or other circuit routing.

Illustrated in FIG. 9 is semiconductor device 10 wherein the patterndefined by photoresist layer 64 is transferred into layers 62, 60 and 58to form openings 66. The pattern transfer, in one form, may beimplemented with either conventional dry or wet etching techniques.

Illustrated in FIG. 10 is semiconductor device 10 wherein openings 66are filled with a conductive material 68 that functions as a first metalstructure by using conventional deposition techniques. In one form, theconductive material 68 is a metal and forms a metal structure. In oneform, conductive material 68 may be implemented with copper, silver,tungsten, nickel, gold, aluminum and alloys thereof, as well as othermetals. It should be apparent that conductive region 52, conductiveregions 54 and conductive material 68 may be formed using conventionaldual in-laid patterning, etch and fill techniques.

Illustrated in FIG. 11 is semiconductor device 10 wherein conductivematerial 68 is planarized to form isolated portions of conductivematerial 68. Conventional planarization techniques, such as CMP, may beused to implement this process step. In an alternate form, theplanarization process may remove enough of conductive material 68 thatlayer 62 is also removed. It should be observed that at this point inthe processing there has been provided a metal structure in the form ofconductive material 68 for providing a back bias for a transistor thatwill be formed around gate electrode 18. In this form, conductive region52 is not required. It is desired for this embodiment that thethicknesses of layers 14 and 40 be minimized.

Illustrated in FIG. 12 is semiconductor device 10 wherein a barrierlayer 72 overlies conductive material 68 and layer 62. In one form,barrier layer 72 is implemented with a dielectric. In other forms,barrier layer 72 could be implemented with a conductive materialdeposited only on the metallic regions of conductive material 68 (i.e.electroless barriers). An oxide layer 73 overlies barrier layer 72. Afirst plate electrode formed of conductive material 75 of a decouplingcapacitor overlies the oxide layer 73. The first plate electrodeconductive material 75 is conductive and is typically a metal such astantalum nitride, aluminum, tantalum, titanium nitride and others. Aninsulating layer 77 overlies the first plate electrode conductivematerial 75 and is preferably a high k dielectric material having adielectric constant in the range of 4.0 or greater. A second plateelectrode formed by conductive material 79 overlies the insulating layer77. The second plate electrode conductive material 79 is also aconductor. A photoresist 81 overlies the semiconductor device 10 andforms a pattern to define a second plate electrode from the first plateelectrode conductive material 75.

Illustrated in FIG. 13 is semiconductor device 10 wherein the secondplate electrode conductive material 79 is formed as a result of aconventional etch process.

Illustrated in FIG. 14 is semiconductor device 10 wherein a nitridelayer 83 is formed overlying the top of the second plate electrodeconductive material 79 as an etch stop layer. Photoresist 85 defines thefirst electrode layer pattern.

As illustrated in FIG. 15, the pattern of photoresist 85 is transferredinto the layers 73, 77 and 83 and conductive material 75. The patternmay be transferred using a conventional dry etch or wet etch or acombination thereof and is selective to the etch stop or barrier layer72. Photoresist 81 is removed from the semiconductor device 10. Asubsequent oxide film 87 that functions as an insulating layer isdeposited and planarized (in one form, a polish) to form a planar uppersurface. A hard mask layer 89 is formed overlying the oxide film 87. Aphotoresist 91 defines via openings for the semiconductor device 10 forcontact to the first and second capacitor plates in addition toconductive material 68. It should be noted that the capacitor formed bythe metal structure or conductive material 75, the insulating layer 77,and the metal structure or conductive material 79 has at least a portionof which is located on a line that is orthogonal to the surface ofactive layer 16 and through the active device (transistor formed by gate18, source region 22 and drain region 23). It should be understood thatsource region 22 and drain region 23 may be implemented as either asource/drain region or a drain/source region depending upon conductivitydoping.

As illustrated in FIG. 16, the via openings are etched in the form of athrough contact via 113, a topside electrode via 93, a bottom sideelectrode via 95 and a via 96. Photoresist 97 defines metal openings.Layer 89 acts as an antireflective coating (ARC) material or as a hardmask material similar to layer 62.

As illustrated in FIG. 17, the pattern defined by photoresist 97 istransferred into layer 89 and oxide film 87. The pattern transfer, inone form, may be implemented with either conventional dry or wet etchingtechniques. Openings are filled with a conductive material 99 thatfunctions as a second metal structure by using conventional depositiontechniques. In one form, the conductive material 99 is a metal and formsa metal structure. In one form, conductive material 99 may beimplemented with copper, silver, tungsten, nickel, gold, aluminum andalloys thereof, as well as other metals. It should be apparent thatconductive material 99 in the regions illustrated may be formed usingconventional dual in-laid patterning, etch, fill and planarizationtechniques similar to FIG. 11. In FIG. 17 a passivation layer 90 isdeposited on conductive material 99 and layer 89. In one form, thepassivation layer 90 may be a carbide, nitride, oxide material or otherdielectric materials.

In this embodiment, an active device in the form of a transistor isformed by polysilicon gate 18 and the associated gate oxide (not shown),backside source region 22 and drain region 23. Assume that in additionto the transistor illustrated, novel structures such as FinFETs orvertical transistors may be used in lieu of a conventional MOSFET.Directly underneath the active device (i.e. the illustrated transistor)is formed a passive device in the form of a capacitive element thatfunctions in one application as a decoupling capacitor. A portion of thedecoupling capacitor is positioned along a line that runs through anyportion of the transistor wherein the line is orthogonal to a surface ofactive layer 16.

Illustrated in FIG. 18 is semiconductor device 10 wherein a finalsubstrate 94 is joined to a passivation layer 101 through a bondinglayer 92. It should be understood that multiple conductive layers (notshown) may separate the conductive material 88 and the passivation layer101. In addition, bonding layer 92 and final substrate 94 may beeliminated and replaced by multiple conductive layers (not shown) toform a conductive bump structure. In such an embodiment, the carriersubstrate 38 is the final substrate.

Illustrated in FIG. 19 is semiconductor device 10 wherein the carriersubstrate 38 and the bonding layer 36 is removed. This removal processmay include conventional techniques such as grinding, chemicalmechanical polish (CMP), wet or dry etching selective to the etch stoplayer 34. In addition, this removal process may include non-contactremoval techniques such as laser lift-off, decomposition of the adhesivematerial, decomposition of bonds, etc. Final substrate 94 thereforebecomes a final substrate for semiconductor device 10. Furtherprocessing for metal layer formation and C4 attachment may beimplemented pursuant to conventional processing techniques.

By now it should be appreciated that there has been provided a methodfor forming a semiconductor device wherein a passive device is formeddirectly beneath an active device. In the illustrated form, the passivedevice is implemented as a capacitor formed by conductive material 75and conductive material 79 as first and second plate electrodes,respectively, and layer 73 as the intervening dielectric. Conductivematerial 79 of the capacitor is contacted to the front side by theinterconnect formed by conductive material 99 and 68 and conductiveregions 54 and one of backside contacts 32. Conductive material 75 ofthe capacitor is also connected to the transistor (i.e. the activedevice) by conductive material 99, 68 and conductive region 52 to thebackside source region 22. Additionally, conductive material 68 may beimplemented as an efficient power plane across a semiconductor die todistribute a power supply voltage across the semiconductor device 10.The power plane would provide direct power to the transistor withouthaving a lateral power plane that would consume circuit layout area.Additionally, the power plane of conductive material 68 may be used toprovide a back bias for the overlying transistor and change thetransistor characteristics by applying a predetermined bias to the powerplane. In such an implementation, conductive region 52 is not connectedto the power plane being used to provide this bias. This bias modifiesthe depletion region of the transistor. Control of the biasing may beimplemented so that sections of transistors within an integrated circuitmay be biased by such a power plane for a predetermined type of circuitoperation or during certain periods of operation, such as for example aperiod dependent upon the amount of power being consumed.

In the foregoing specification, the invention has been described withreference to specific embodiments. However, one of ordinary skill in theart appreciates that various modifications and changes can be madewithout departing from the scope of the present invention as set forthin the claims below. For example, any type of active device other than atransistor may be implemented such as diodes, photodetectors, MEM (microelectro mechanical) devices and optical sources. Various transistorstructures that have a diffusion region may be implemented. Any type ofpassive device other than a capacitor may be implemented, such asresistors, inductors, waveguides, cavities, optical interconnects,optical components, couplers, heat dissipation elements and heat sinks.Any type of packaging interconnects may be incorporated withsemiconductor device 10 both at the front-side and the back-side.Various materials other than the specific examples described herein maybe used for the conductors and insulators described herein. Accordingly,the specification and figures are to be regarded in an illustrativerather than a restrictive sense, and all such modifications are intendedto be included within the scope of the present invention.

Benefits, other advantages, and solutions to problems have beendescribed above with regard to specific embodiments. However, thebenefits, advantages, solutions to problems, and any element(s) that maycause any benefit, advantage, or solution to occur or become morepronounced are not to be construed as a critical, required, or essentialfeature or element of any or all the claims. As used herein, the terms“comprises,” “comprising,” or any other variation thereof, are intendedto cover a non-exclusive inclusion, such that a process, method,article, or apparatus that comprises a list of elements does not includeonly those elements but may include other elements not expressly listedor inherent to such process, method, article, or apparatus.

1. A semiconductor device comprising: a layer of material having a firstsurface and a second surface, the second surface opposite the firstsurface; a transistor having a control electrode, a first currentelectrode and a second current electrode overlying the first surface,the control electrode positioned closer to the layer of material thanthe first current electrode and the second current electrode; a firstmetal structure formed further away from the first surface of the layerof material than the transistor, at least a portion of the first metalstructure overlying the transistor; an insulating layer formed furtheraway from the first surface of the layer of material than the firstmetal structure, overlying the first metal structure and at least aportion of the transistor; and a second metal structure formed furtheraway from the first surface of the layer of material than the insulatinglayer, the second metal structure overlying the insulating layer and atleast a portion of the transistor; wherein the first metal structure,the insulating layer, and the second metal structure form a capacitiveelement overlying the transistor, at least a portion of the capacitiveelement located on a line that is orthogonal to the first surface andthrough a portion of the transistor; a first conductive path coupledbetween the first metal structure of the capacitive element and at leastone of the first current electrode and the second current electrode forelectrically connecting the capacitive clement and the transistor; and asecond conductive path coupled to the second metal structure of thecapacitive element, the second conductive path extending both above andbelow the capacitive element, the second conductive path having aportion that is lateral to the transistor, the second conductive pathproviding connection to the capacitive element from above or below thecapacitive element or both.
 2. The semiconductor device of claim 1,wherein the first conductive path comprises a plurality of conductivecontiguous layers.
 3. The semiconductor device of claim 2, wherein thefirst conductive path connects one of the first current electrode andthe second current electrode of the transistor to the first metalstructure of the capacitive element.
 4. The semiconductor device ofclaim 1, wherein the first current electrode and second currentelectrode each comprise a diffusion formed in a semiconductor layerpositioned between the control electrode and the first metal structureof the capacitive element.
 5. The semiconductor device of claim 1wherein both the first conductive path and the second conductive pathextend above a plane of an upper surface of the capacitive element andboth the first conductive path and the second conductive path extendbelow a plane of a lower surface of the capacitive element.
 6. Thesemiconductor device of claim 1, wherein the first conductive pathcomprises a plurality of connecting conductive layers, one of theconnecting conductive layers for providing a back bias for thetransistor.
 7. A semiconductor device comprising: a semiconductorsubstrate having a first surface and a second surface, the secondsurface opposite the first surface; a transistor overlying thesemiconductor substrate and having a control electrode, a first currentelectrode and a second current electrode formed above the first surface,the control electrode positioned closer to the semiconductor substratethan the first current electrode and the second current electrode; acapacitor having a first electrode and a second electrode formed abovethe transistor and on a same side of the semiconductor substrate as thetransistor, at least a portion of the capacitor located on a line thatis orthogonal to the first surface and through a portion of thetransistor; a first conductive path connecting the first electrode ofthe capacitor to at least one of the first current electrode and thesecond current electrode of the transistor; and a second conductive pathconnected to the second electrode of the capacitor and extending bothabove and below the capacitor to be at least lateral to the transistor,the second conductive path providing connection to the capacitor fromabove or below the capacitor or both.
 8. A semiconductor devicecomprising: a layer of material having a first surface and a secondsurface, the second surface opposite the first surface; a transistorunderlying the layer of material and having a control electrode, a firstcurrent electrode and a second current electrode below the firstsurface, the control electrode positioned closer to the layer ofmaterial than the first current electrode and the second currentelectrode; a capacitor positioned below the transistor wherein at leasta portion of the capacitive element located on a line that is orthogonalto the first surface and through the transistor; a first conductive pathcomprising at least one conductive layer located between the capacitiveelement and at least one of the first current electrode and the secondcurrent electrode for electrically connecting the capacitive element andthe transistor; and a second conductive path connected to the secondelectrode of the capacitor and extending both above and below thecapacitor to be at least lateral to the transistor, the secondconductive path providing connection to the capacitor from above orbelow the capacitor or both.